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Physics Colloquium Series: Prof. Robert Klie
(Physics Lecture Series) University of Illinois at Chicago, Department of Physics
“Atomic-Resolution In-Situ Characterization of Low-Dimensional Materials”
The last few years have seen a paradigm change in the way we characterize materials, with unprecedented improvements in both spatial and spectroscopic resolution being realized by aberration-corrected transmission electron microscopes. While spatial and energy resolutions better than 60 pm and 10 meV have been reported in a transmission electron microscope, aberration-correction has also enabled a large variety of in-situ experiments at close to atomic resolution. In this presentation, I will focus on the atomic-scale in-situ characterization of complex oxide thin films, transition metal dichalcogenides, as well as solid-liquid interfaces. I will also discuss my vision for the future of both electron and X-ray microscopy, including monochromated electron-sources, new data processing approaches for low dose microscopy as well as multi-modal methods combing x-ray and electron scattering.